報告題目：Recent developments in soft x-ray micro spectroscopy and their application to soft matter
報告人：Prof. Dr. Rainer Fink
報告人簡介：Rainer Fink (born 1960) studied Physics at the University of Konstanz. He was research assistant at Uppsala University and the University of Würzburg. Since April 2002 he is C3 professor for Physical Chemistry at the FAU Erlangen-Nürnberg. Rainer Fink has a strong expertise in the development and use of ultimately resolving x-ray based microscopic techniques. The applications range from organic hybrid materials and polymer films to ultrathin organic films from functionalized molecules. Lately, various in-situ detection techniques were developed to study the electronic properties of organic electronic devices with resolutions in the range of few 10 nm. These techniques offer straightforward and complementary use to all kind of nanostructured objects, with potential applications in 3D imaging using the near-edge x-ray absorption fine structure (NEXAFS) as chemical fingerprint. High-spectral resolution may serve as probe to detect the coupling of electronic and vibronic modes in organic thin film devices. Rainer Fink has a track record of more than 150 publications in peer-reviewed scientific journals and has strong scientific relations with institutions in Shanghai. During the last few years he fulfilled various positions in the administration of the School of Sciences at FAU, amongst them coordination of the Erlangen-Wollongong student exchange programme.
報告摘要：Soft x-rays are ideally suited to analyze soft materials. Near-edge x-ray absorption fine structure (NEXAFS/XANES) serves as spectroscopic fingerprint in chemical analysis, also in multinary soft matter systems. Combining this specific advantage with spatially resolving techniques, we will be able to investigate specimens on the length scales close to the molecular level. Using zone-plate based microspectroscopy with latest technologies, we were able to push this technique towards its ultimate resolution. The talk discusses some recent achievement in 2D and 3D scanning transmission x-ray microscopy and specific applications, ranging from material science to organic electronic devices.